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Field-Emission Scanning Electron Microscope (FE-SEM) with Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS) Detectors and Analytical Software.

AgencyCOMMERCE, DEPARTMENT OF
Solicitation #NB642050-26-01074
Posted2026-07-17
Response Deadline2026-07-31
NAICS Code334516
Set-AsideNone
Place of PerformanceGaithersburg, Maryland
Point of ContactSadaf Afkhami <Sadaf.Afkhami@nist.gov>
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